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Mechanical and structural properties of fluorine-ion-implanted boron suboxide

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dc.contributor.author Machaka, Ronald
dc.contributor.author Mwakikunga, Bonex W
dc.contributor.author Manikandan, E
dc.contributor.author Derry, TE
dc.contributor.author Sigalas, I
dc.contributor.author Herrmann, M
dc.date.accessioned 2012-01-19T10:20:36Z
dc.date.available 2012-01-19T10:20:36Z
dc.date.issued 2011-09
dc.identifier.citation Machaka, R., Mwakikunga, B.W., Manikandan, E. et al. 2011. Mechanical and structural properties of fluorine-ion-implanted boron suboxide. Advances in Materials Science and Engineering, Vol (2012), pp12 en_US
dc.identifier.issn 1687-8434
dc.identifier.issn 1687-8442
dc.identifier.uri http://www.hindawi.com/journals/amse/
dc.identifier.uri http://hdl.handle.net/10204/5511
dc.identifier.uri https://www.hindawi.com/journals/amse/2012/792973/
dc.identifier.uri https://doi.org/10.1155/2012/792973
dc.description Copyright: 2011 Hindawi Publishing Corporation en_US
dc.description.abstract Results on a systematic study on the effects of ion implantation on the near-surface mechanical and structural properties of boron suboxide (B6O) prepared by uniaxial hot pressing are reviewed. 150 keV fluorine ions at fluences of up to 5.0 × 1016 ions/cm2 were implanted into the ultrahard ceramic material at room temperature and characterized using Raman spectroscopy, atomic force microscopy (AFM), and scanning electron microscopy (SEM) with energy-dispersive X-ray spectroscopy (EDX). Evidence of ion-beam-assisted nucleation of novel clustered BxOyFz particles by ion implantation is revealed. In addition, obtained results also reveal that fluorine implantation into the B6O specimen leads to an overall degradation of near-surface mechanical properties with increasing fluorine fluence. Implications of these observations in the creation of amorphous near-surface layers by high-dose ion implantation are discussed in this paper. en_US
dc.language.iso en en_US
dc.publisher Hindawi Publishing Corporation en_US
dc.relation.ispartofseries Workflow request;7902
dc.subject Ion implantation en_US
dc.subject Boron suboxide en_US
dc.subject Scanning electron microscopy en_US
dc.subject Atomic force microscopy en_US
dc.subject Materials Science en_US
dc.subject Engineering en_US
dc.title Mechanical and structural properties of fluorine-ion-implanted boron suboxide en_US
dc.type Article en_US
dc.identifier.apacitation Machaka, R., Mwakikunga, B. W., Manikandan, E., Derry, T., Sigalas, I., & Herrmann, M. (2011). Mechanical and structural properties of fluorine-ion-implanted boron suboxide. http://hdl.handle.net/10204/5511 en_ZA
dc.identifier.chicagocitation Machaka, Ronald, Bonex W Mwakikunga, E Manikandan, TE Derry, I Sigalas, and M Herrmann "Mechanical and structural properties of fluorine-ion-implanted boron suboxide." (2011) http://hdl.handle.net/10204/5511 en_ZA
dc.identifier.vancouvercitation Machaka R, Mwakikunga BW, Manikandan E, Derry T, Sigalas I, Herrmann M. Mechanical and structural properties of fluorine-ion-implanted boron suboxide. 2011; http://hdl.handle.net/10204/5511. en_ZA
dc.identifier.ris TY - Article AU - Machaka, Ronald AU - Mwakikunga, Bonex W AU - Manikandan, E AU - Derry, TE AU - Sigalas, I AU - Herrmann, M AB - Results on a systematic study on the effects of ion implantation on the near-surface mechanical and structural properties of boron suboxide (B6O) prepared by uniaxial hot pressing are reviewed. 150 keV fluorine ions at fluences of up to 5.0 × 1016 ions/cm2 were implanted into the ultrahard ceramic material at room temperature and characterized using Raman spectroscopy, atomic force microscopy (AFM), and scanning electron microscopy (SEM) with energy-dispersive X-ray spectroscopy (EDX). Evidence of ion-beam-assisted nucleation of novel clustered BxOyFz particles by ion implantation is revealed. In addition, obtained results also reveal that fluorine implantation into the B6O specimen leads to an overall degradation of near-surface mechanical properties with increasing fluorine fluence. Implications of these observations in the creation of amorphous near-surface layers by high-dose ion implantation are discussed in this paper. DA - 2011-09 DB - ResearchSpace DP - CSIR KW - Ion implantation KW - Boron suboxide KW - Scanning electron microscopy KW - Atomic force microscopy KW - Materials Science KW - Engineering LK - https://researchspace.csir.co.za PY - 2011 SM - 1687-8434 SM - 1687-8442 T1 - Mechanical and structural properties of fluorine-ion-implanted boron suboxide TI - Mechanical and structural properties of fluorine-ion-implanted boron suboxide UR - http://hdl.handle.net/10204/5511 ER - en_ZA


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