dc.contributor.author |
Toudjeu, IT
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dc.contributor.author |
Van Wyk, BJ
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dc.contributor.author |
Van Wyk, MA
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dc.contributor.author |
Van Den Bergh, F
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dc.date.accessioned |
2009-01-20T07:44:37Z |
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dc.date.available |
2009-01-20T07:44:37Z |
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dc.date.issued |
2008-06 |
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dc.identifier.citation |
Toudjeu, IT, Van Wyk, BJ, Van Wyk, MA and Van Den Bergh, F. 2008. Global image feature extraction using slope pattern spectra. 5th International Conference on Image Analysis and Recognition (ICIAR), Povoa de Varzim, Portugal, 25-27 June 2008, pp 640-649. |
en |
dc.identifier.uri |
http://www.springer.de/comp/lncs/index.html
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dc.identifier.uri |
http://hdl.handle.net/10204/2848
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dc.description |
The copyright for this contribution is held by Springer |
en |
dc.description.abstract |
Traditionally, granulometries are obtained using a series of openings or closings with convex structuring elements of increasing size. Granulometries constitute a useful tool for texture and image analysis since they are used to characterize size distributions and shapes [1], [2]. The granulometric analysis of an image results in a signature of the image with respect to the granulometry used which is referred to as a granulometric curve or pattern spectrum. Granulometric curves are used as feature vectors [3] for applications such as segmentation [4] and texture classification [5]. For example [6], granulometries based on openings with squares of increasing size as structuring elements, were used to extract dominant bean diameter from binary images of coffee beans. Granulometries were also used to estimate the dominant width of the white patterns in the X-ray images of welds [7]. Due to the computational load associated with the calculation of granulometries, Vincent [6], building on the work of Haralick et al. [2] and proposed fast and efficient granulometric techniques using linear openings. |
en |
dc.language.iso |
en |
en |
dc.publisher |
Springer-Verlag Berlin Heidelberg |
en |
dc.subject |
Pattern Spectra |
en |
dc.subject |
Feature extraction |
en |
dc.subject |
Texture analysis |
en |
dc.subject |
Integral image |
en |
dc.title |
Global image feature extraction using slope pattern spectra |
en |
dc.type |
Conference Presentation |
en |
dc.identifier.apacitation |
Toudjeu, I., Van Wyk, B., Van Wyk, M., & Van Den Bergh, F. (2008). Global image feature extraction using slope pattern spectra. Springer-Verlag Berlin Heidelberg. http://hdl.handle.net/10204/2848 |
en_ZA |
dc.identifier.chicagocitation |
Toudjeu, IT, BJ Van Wyk, MA Van Wyk, and F Van Den Bergh. "Global image feature extraction using slope pattern spectra." (2008): http://hdl.handle.net/10204/2848 |
en_ZA |
dc.identifier.vancouvercitation |
Toudjeu I, Van Wyk B, Van Wyk M, Van Den Bergh F, Global image feature extraction using slope pattern spectra; Springer-Verlag Berlin Heidelberg; 2008. http://hdl.handle.net/10204/2848 . |
en_ZA |
dc.identifier.ris |
TY - Conference Presentation
AU - Toudjeu, IT
AU - Van Wyk, BJ
AU - Van Wyk, MA
AU - Van Den Bergh, F
AB - Traditionally, granulometries are obtained using a series of openings or closings with convex structuring elements of increasing size. Granulometries constitute a useful tool for texture and image analysis since they are used to characterize size distributions and shapes [1], [2]. The granulometric analysis of an image results in a signature of the image with respect to the granulometry used which is referred to as a granulometric curve or pattern spectrum. Granulometric curves are used as feature vectors [3] for applications such as segmentation [4] and texture classification [5]. For example [6], granulometries based on openings with squares of increasing size as structuring elements, were used to extract dominant bean diameter from binary images of coffee beans. Granulometries were also used to estimate the dominant width of the white patterns in the X-ray images of welds [7]. Due to the computational load associated with the calculation of granulometries, Vincent [6], building on the work of Haralick et al. [2] and proposed fast and efficient granulometric techniques using linear openings.
DA - 2008-06
DB - ResearchSpace
DP - CSIR
KW - Pattern Spectra
KW - Feature extraction
KW - Texture analysis
KW - Integral image
LK - https://researchspace.csir.co.za
PY - 2008
T1 - Global image feature extraction using slope pattern spectra
TI - Global image feature extraction using slope pattern spectra
UR - http://hdl.handle.net/10204/2848
ER -
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en_ZA |