dc.contributor.author |
Copeman, JH
|
|
dc.contributor.author |
Von Wolff, WTE
|
|
dc.date.accessioned |
2023-07-25T13:08:43Z |
|
dc.date.available |
2023-07-25T13:08:43Z |
|
dc.date.issued |
1968 |
|
dc.identifier.citation |
Copeman, J. & Von Wolff, W. 1968. <i>The quantitative determination of quartz by means of x-ray diffraction methods</i>. http://hdl.handle.net/10204/12914 . |
en_ZA |
dc.identifier.uri |
http://hdl.handle.net/10204/12914
|
|
dc.description.abstract |
When certain component, in a mixture with other components, has to be determined in a sample, one cannot directly compare line intensities of the pure component, proposed under identical conditions as the sample, because of the absorption effects of the matrix pertaining to the sample. |
en_US |
dc.format |
Fulltext |
en_US |
dc.language.iso |
en |
en_US |
dc.subject |
Diffraction methods |
en_US |
dc.subject |
X-ray diffraction |
en_US |
dc.subject |
Flourite lines |
en_US |
dc.title |
The quantitative determination of quartz by means of x-ray diffraction methods |
en_US |
dc.type |
Report |
en_US |
dc.description.pages |
8pp |
en_US |
dc.description.reportnumber |
TM 16/1968 |
en_US |
dc.identifier.apacitation |
Copeman, J., & Von Wolff, W. (1968). <i>The quantitative determination of quartz by means of x-ray diffraction methods</i> Retrieved from http://hdl.handle.net/10204/12914 |
en_ZA |
dc.identifier.chicagocitation |
Copeman, JH, and WTE Von Wolff <i>The quantitative determination of quartz by means of x-ray diffraction methods.</i> 1968. http://hdl.handle.net/10204/12914 |
en_ZA |
dc.identifier.vancouvercitation |
Copeman J, Von Wolff W. The quantitative determination of quartz by means of x-ray diffraction methods. 1968 [cited yyyy month dd]. Available from: http://hdl.handle.net/10204/12914 |
en_ZA |
dc.identifier.ris |
TY - Report
AU - Copeman, JH
AU - Von Wolff, WTE
AB - When certain component, in a mixture with other components, has to be determined in a sample, one cannot directly compare line intensities of the pure component, proposed under identical conditions as the sample, because of the absorption effects of the matrix pertaining to the sample.
DA - 1968
DB - ResearchSpace
DP - CSIR
KW - Diffraction methods
KW - X-ray diffraction
KW - Flourite lines
LK - https://researchspace.csir.co.za
PY - 1968
T1 - The quantitative determination of quartz by means of x-ray diffraction methods
TI - The quantitative determination of quartz by means of x-ray diffraction methods
UR - http://hdl.handle.net/10204/12914
ER -
|
en_ZA |
dc.identifier.worklist |
n/a |
en_US |