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Comparison of various CEM methods to predict RCS of lossy dielectrics
Pienaar, Ciara
;
Odendaal, JW
;
Joubert, J
;
Pienaar, M
;
Smit, Johan C
(
IEEE
,
2017-09
)
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Joubert, J (1)
Odendaal, JW (1)
Pienaar, Ciara (1)
Pienaar, M (1)
Smit, Johan C (1)
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CEM modelling (1)
Computational electromagnetic (1)
Dielectric scattering (1)
Radar Cross Section (1)
RCS (1)
RCS measurements (1)
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2017 (1)
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