Author:Pienaar, Ciara; Odendaal, JW; Joubert, J; Pienaar, M; Smit, Johan CDate:Sep 2017The accuracy with which various full-wave and asymptotic CEM techniques can calculate the RCS of lossy dielectric objects is investigated. This is conducted through comparison to measured RCS data. The investigated methods include MLFMM, FEM, ...Read more