Author:Baisitse, TR; Forbes, A; Katumba, G; Botha, JR; Engelbrecht, JAADate:2008In this paper, infrared reflectance spectroscopy was employed to extract information on the optical and electrical properties of metal organic vapour phase epitaxial (MOVPE) grown InAs and InAsSb epilayers. These epitaxial layers were grown ...Read more
Author:Krug, T; Botha, L; Shamba, P; Baisitse, TR; Venter, A; Engelbrecht, JAA; Botha, JRDate:2006Strong surface inversion usually leads to deceptive Hall measurements by reflecting typical n-type behaviour for p-type samples, especially at very low doping concentrations. A two-layer model is presented which can potentially be used to ...Read more